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Conference on Advanced  Phase Measurement Methods in Optical Metrology

17 - 21 May 2010

At Monte Verita, Locarno,

Switzerland

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Important dates
Abstract Submission deadline 18/10/2009
Notification of acceptance 15/11/2009
Manuscript due date 29/01/2010
Registration deadline 26/02/2010
Conference dates 17-21/05/2010
 

The Conference Chairs, Prof. Pramod Rastogi and Dr Erwin Hack invite you to Switzerland to be a part of the Conference on Advanced Phase Measurement Methods in Optics and Imaging which will be held at Monte Verita, Locarno, between 17 and 21 May 2010.

The main conference objectives are to:

  • stimulate discussion among different branches of metrology

  • further the understanding of the general concept of phase
  • present the state of the art through key note and invited lectures
  • discuss emerging research topics and trends

The stimulating and unique ambiance of Monte Verita is chosen to organize a conference with a familiar and scientifically inspiring fragrance. It is intended to have invited papers to start each session. Only plenary lectures are planned to guarantee open and broad discussions.

Two types of contributions are solicited:

  • Original research contributions (20 min)

  • Short presentations (12 min) on timely topics

This conference is sponsored by the Swiss National Science Foundation and the Centro Stefano Franscini.